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Just18
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« on: February 13, 2012, 09:32:25 AM » |
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I am working on a PC with an 80GB SATA HDD ...... Win needs it to be in emulation mode or whatever it is called, apparently as it is not AHCI in BIOS. That said, I suspect the drive is failing. I have deleted and recreated a NTFS partition on the drive, thinking that I would be offered a badblock check during formatting ...... not so it seems when using MS filesystem. So I want to check this drive for bad blocks and/or other hardware problems. I will be running PCLOS live from a USB stick to do the checks. Rather than go ahead and take a mis-step, I would appreciate others views on the preferred procedure ...... use of badblocks, smartmon etc Thanks for your thoughts 
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Just18
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« Reply #1 on: February 13, 2012, 10:09:45 AM » |
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OK, I install Gsmartcontrol, and ran a Short Self Test on the suspect drive. Although no parameters are marked as failed, the drive failed the read test ...... Error 6105 occurred at disk power-on lifetime : 7166 (298 days + 14 hours) The log shows it as "uncorrectable error is data" I guess that is it. Dump the drive! end. 
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Just18
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« Reply #2 on: February 13, 2012, 12:39:11 PM » |
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I connected a second 80GB SATA drive in place of the faulty one. This again was a used drive. It passed the initial short test ....... but failed on the more comprehensive test with a read failure about 50% EDIT 10% of the way through. The 'lifetime hours' on this one being much lower at 590 I thought to do some experimenting. I zeroed the drive using dd, then repeated the two tests. This time it passed BOTH! No errors reported. I think I will try zeroing the first drive also, just to see if it makes any difference at all ........ In the meantime I will hold the now apparently 'good' drive to see if there are any suggestions for further tests. 'I will be back' ..... 
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AS
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« Reply #3 on: February 13, 2012, 02:11:19 PM » |
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I connected a second 80GB SATA drive in place of the faulty one. This again was a used drive. It passed the initial short test ....... but failed on the more comprehensive test with a read failure about 50% of the way through. The 'lifetime hours' on this one being much lower at 590 I thought to do some experimenting. I zeroed the drive using dd, then repeated the two tests. This time it passed BOTH! No errors reported. I think I will try zeroing the first drive also, just to see if it makes any difference at all ........ In the meantime I will hold the now apparently 'good' drive to see if there are any suggestions for further tests. 'I will be back' .....  SATA drives do have spare sectors, when you write a bad sector and the disk logic recognize it was badly written, it automatically map a spare sector in place of the bad one, until the spare sectors will be exhausted.  Check the hard disk manual from the producer for further info, and thank you for confirming something I'm saying repeatedly. AS
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Just18
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« Reply #4 on: February 13, 2012, 02:30:44 PM » |
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I plugged in the first BAD drive again. I corrected my post ..... it was at 10% that it failed -- was in the logs. So I wrote zeros to the complete drive ..... using dcfldd this time to see a progress repot. This time the initial read error was reported at 30% from the short test. So apparently the first lot of errors were 'fixed' by writing zeros! (yes I know ... still doubtful  ) So, rather than do the extended test which would not go past the 30% anyway, I decided to write 1's to the complete drive. I am presently waiting for this to finish, after which I will do the smartmon tests again to see if there is any difference, before returning the drive to zeros. ...... to be continued .... the results were that both short and long tests stopped at about 10% again. This time they both error'd at a different LBA ...... 972785 whereas previously it had been 972783 It appears that the 30% report is an error ...... the LBA for that was 719368 So the error location seems to have changed ever so slightly ..... and that is all. Now writing zeros to the drive again, before dumping it. 
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« Reply #5 on: February 13, 2012, 02:41:51 PM » |
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At any time, before or after writing, zeroing or whatever, I would like to see a report from: smartctl -a /dev/sdXn 
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Just18
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« Reply #6 on: February 13, 2012, 02:57:32 PM » |
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At any time, before or after writing, zeroing or whatever, I would like to see a report from: smartctl -a /dev/sdXn  Here ye go ......  Note: Two tests - short & long - after writing 1s stopped at LBA 972785 and for some reason don't appear in this log.
Also prior to writing 1s I did a short test which showed failure at 30% (not 10% as all the others) with LBA of first error listed as 719368
Just a couple of apparent inconsistencies before the full report below.
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smartctl 5.41 2011-06-09 r3365 [i686-linux-2.6.38.8-pclos3.bfs] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION === Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus Device Model: ST380817AS Serial Number: 4MR0RXM3 Firmware Version: 3.42 User Capacity: 80,026,361,856 bytes [80.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2 Local Time is: Mon Feb 13 19:49:13 2012 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled
=== START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED
General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 121) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 47) minutes.
SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 055 046 006 Pre-fail Always - 209476916 3 Spin_Up_Time 0x0003 098 098 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 097 097 020 Old_age Always - 3214 5 Reallocated_Sector_Ct 0x0033 084 084 036 Pre-fail Always - 646 7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 395035074 9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 7169 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 097 097 020 Old_age Always - 3172 194 Temperature_Celsius 0x0022 028 047 000 Old_age Always - 28 195 Hardware_ECC_Recovered 0x001a 055 046 000 Old_age Always - 209476916 197 Current_Pending_Sector 0x0012 100 095 000 Old_age Always - 6 198 Offline_Uncorrectable 0x0010 100 095 000 Old_age Offline - 6 199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 1 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 202 Data_Address_Mark_Errs 0x0032 069 222 000 Old_age Always - 31
SMART Error Log Version: 1 ATA Error Count: 6105 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 6105 occurred at disk power-on lifetime: 7166 hours (298 days + 14 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ef d7 0e e0 Error: UNC at LBA = 0x000ed7ef = 972783
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 ef d7 0e e0 00 00:53:44.028 READ DMA 27 00 00 00 00 00 e0 00 00:53:44.024 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:53:51.781 IDENTIFY DEVICE ef 03 46 00 00 00 a0 00 00:53:51.781 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:53:51.778 READ NATIVE MAX ADDRESS EXT
Error 6104 occurred at disk power-on lifetime: 7166 hours (298 days + 14 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ef d7 0e e0 Error: UNC at LBA = 0x000ed7ef = 972783
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 ef d7 0e e0 00 00:53:44.028 READ DMA 27 00 00 00 00 00 e0 00 00:53:44.024 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:53:44.022 IDENTIFY DEVICE ef 03 46 00 00 00 a0 00 00:53:44.021 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:53:44.019 READ NATIVE MAX ADDRESS EXT
Error 6103 occurred at disk power-on lifetime: 7166 hours (298 days + 14 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ef d7 0e e0 Error: UNC at LBA = 0x000ed7ef = 972783
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 ef d7 0e e0 00 00:53:44.028 READ DMA 27 00 00 00 00 00 e0 00 00:53:44.024 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:53:44.022 IDENTIFY DEVICE ef 03 46 00 00 00 a0 00 00:53:44.021 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:53:44.019 READ NATIVE MAX ADDRESS EXT
Error 6102 occurred at disk power-on lifetime: 7166 hours (298 days + 14 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ef d7 0e e0 Error: UNC at LBA = 0x000ed7ef = 972783
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 ef d7 0e e0 00 00:53:36.251 READ DMA 27 00 00 00 00 00 e0 00 00:53:36.248 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:53:32.373 IDENTIFY DEVICE ef 03 46 00 00 00 a0 00 00:53:32.373 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:53:32.370 READ NATIVE MAX ADDRESS EXT
Error 6101 occurred at disk power-on lifetime: 7166 hours (298 days + 14 hours) When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ef d7 0e e0 Error: UNC at LBA = 0x000ed7ef = 972783
Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 ef d7 0e e0 00 00:53:36.251 READ DMA 27 00 00 00 00 00 e0 00 00:53:36.248 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 00:53:32.373 IDENTIFY DEVICE ef 03 46 00 00 00 a0 00 00:53:32.373 SET FEATURES [Set transfer mode] 27 00 00 00 00 00 e0 00 00:53:32.370 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed: read failure 90% 7168 972785 # 2 Short offline Completed: read failure 90% 7168 972785 # 3 Short offline Completed: read failure 90% 7168 972785 # 4 Short offline Completed: read failure 70% 7168 719368 # 5 Extended offline Completed: read failure 90% 7166 972783 # 6 Short offline Completed: read failure 90% 7166 972783 # 7 Extended offline Completed: read failure 90% 7166 972783 # 8 Short offline Completed: read failure 90% 7166 972783 # 9 Short captive Interrupted (host reset) 90% 5015 - #10 Short captive Completed without error 00% 3510 -
SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
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« Reply #7 on: February 13, 2012, 03:09:17 PM » |
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Thank you! Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus Device Model: ST380817AS Serial Number: 4MR0RXM3 Firmware Version: 3.42 User Capacity: 80,026,361,856 bytes [80.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2 Local Time is: Mon Feb 13 19:49:13 2012 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled
=== START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED
General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 121) The previous self-test completed having the read element of the test failed. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 47) minutes.
SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 055 046 006 Pre-fail Always - 209476916 3 Spin_Up_Time 0x0003 098 098 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 097 097 020 Old_age Always - 3214 5 Reallocated_Sector_Ct 0x0033 084 084 036 Pre-fail Always - 646 7 Seek_Error_Rate 0x000f 085 060 030 Pre-fail Always - 395035074 9 Power_On_Hours 0x0032 092 092 000 Old_age Always - 7169 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 097 097 020 Old_age Always - 3172 194 Temperature_Celsius 0x0022 028 047 000 Old_age Always - 28 195 Hardware_ECC_Recovered 0x001a 055 046 000 Old_age Always - 209476916 197 Current_Pending_Sector 0x0012 100 095 000 Old_age Always - 6 198 Offline_Uncorrectable 0x0010 100 095 000 Old_age Offline - 6 199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 1 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 202 Data_Address_Mark_Errs 0x0032 069 222 000 Old_age Always - 31 33 27 00 00 00 00 00 e0 00 00:53:44.019 READ NATIVE MAX ADDRESS EXT
http://sourceforge.net/apps/trac/smartmontools/wiki/FAQ#UnreadableuncorrectablependingsectorsorMediumerrorondisk.Whatsgoingonalso, from the same author of smart utilities: http://www.linuxjournal.com/magazine/monitoring-hard-disks-smart?page=0,0
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Just18
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« Reply #8 on: February 13, 2012, 03:19:13 PM » |
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I had wondered if the item second from bottom might have had an effect ---- the interrupt being at or about where the failure now occurs. 
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« Reply #9 on: February 13, 2012, 03:20:26 PM » |
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Addition, still from Bruce Allen: http://smartmontools.sourceforge.net/badblockhowto.htmlNote: this one is especially for the pleasure of those who love CHS/LBA math wedgetail ? 
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Just18
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« Reply #10 on: February 13, 2012, 03:24:15 PM » |
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Not for me 
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« Reply #11 on: February 13, 2012, 03:27:50 PM » |
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I had wondered if the item second from bottom might have had an effect ---- the interrupt being at or about where the failure now occurs.
I think no, because I have interrupted smart tests may times, without any adverse effect ... Your disk appear to have had the first error at 7166 hours .... I missed this one before ... edited post 5 Reallocated_Sector_Ct 0x0033 084 084 036 Pre-fail Always - 646
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Just18
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« Reply #12 on: February 13, 2012, 06:29:43 PM » |
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I had wondered if the item second from bottom might have had an effect ---- the interrupt being at or about where the failure now occurs.
I think no, because I have interrupted smart tests may times, without any adverse effect ... Your disk appear to have had the first error at 7166 hours .... 7166 hours is when I began testing it ...... the interrupt happened long before and there was no test in the meantime it seems. I only got the drive yesterday and I suspect that the interrupt could have corrupted something long before I got it. I missed this one before ... edited post 5 Reallocated_Sector_Ct 0x0033 084 084 036 Pre-fail Always - 646 I don't know the significance 
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« Reply #13 on: February 13, 2012, 06:37:17 PM » |
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I had wondered if the item second from bottom might have had an effect ---- the interrupt being at or about where the failure now occurs.
I think no, because I have interrupted smart tests may times, without any adverse effect ... Your disk appear to have had the first error at 7166 hours .... 7166 hours is when I began testing it ...... the interrupt happened long before and there was no test in the meantime it seems. I only got the drive yesterday and I suspect that the interrupt could have corrupted something long before I got it. I missed this one before ... edited post 5 Reallocated_Sector_Ct 0x0033 084 084 036 Pre-fail Always - 646 I don't know the significance  The reallocated sectors are those sectors found bad and reallocated to the spare track/sectors ... I would not use such drive for anything valuable ...
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« Reply #14 on: February 13, 2012, 06:44:32 PM » |
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I will be away for a couple of days, but hope to get back to this next weekend ........ when I intend to run a manufacturers diagnostic on it. How does one know if the area which stores the info for smartmon/manufacturer/etc is not corrupted? I recall reading about it having a duplicate area in case of problems ...... just wondering if there is any way to determine if anything has gone wrong there. This drive is written off, so anything I do to it does not affect anything/anybody ...... it is ripe for 'play' 
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